"Two-sided empirical Bayes test for truncation parameter using NA samples."

Yimin Shi, Xiaolin Shi, Jie Yan (2005)

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DOI: 10.1016/J.INS.2004.06.007

access: closed

type: Journal Article

metadata version: 2017-05-27

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Yimin Shi, Xiaolin Shi, Jie Yan:
Two-sided empirical Bayes test for truncation parameter using NA samples. Inf. Sci. 173(1-3): 65-74 (2005)

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