"Regression of feature scale tracklets for decimeter visual localization."

David Wong et al. (2017)

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DOI: 10.1016/J.IMAVIS.2017.07.004

access: closed

type: Journal Article

metadata version: 2024-05-07

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David Wong, Daisuke Deguchi, Yasutomo Kawanishi, Ichiro Ide, Hiroshi Murase:
Regression of feature scale tracklets for decimeter visual localization. Image Vis. Comput. 68: 53-63 (2017)

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