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"Non-destructive one-shot device test under step-stress experiment with ..."

Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo (2024)

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DOI: 10.1016/J.CAM.2023.115483

access: open

type: Journal Article

metadata version: 2024-01-07

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Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo:
Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution. J. Comput. Appl. Math. 437: 115483 (2024)

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