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"Detecting faults in inner product masking scheme."
Wei Cheng et al. (2021)
- Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley:
Detecting faults in inner product masking scheme. J. Cryptogr. Eng. 11(2): 119-133 (2021)
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