"Extraction and Simulation of Intra-gate Defects Affecting CMOS Libraries."

Aymen Ladhar, Mohamed Masmoudi (2010)

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DOI: 10.4304/JCP.5.10.1468-1477

access: open

type: Journal Article

metadata version: 2025-03-03

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Aymen Ladhar, Mohamed Masmoudi:
Extraction and Simulation of Intra-gate Defects Affecting CMOS Libraries. J. Comput. 5(10): 1468-1477 (2010)

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