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"Stochastic Delay Characterization for Multicoupled RLC Interconnects Under ..."

Jin Sun et al. (2019)

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DOI: 10.1142/S0218126619501524

access: closed

type: Journal Article

metadata version: 2022-03-16

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Jin Sun, Xin Li, Zhichao Lian, Min Li:
Stochastic Delay Characterization for Multicoupled RLC Interconnects Under Process Variations. J. Circuits Syst. Comput. 28(9): 1950152:1-1950152:20 (2019)

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