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"Microprocessor Testing: Functional Meets Structural Test."

Aymen Touati et al. (2017)

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DOI: 10.1142/S0218126617400072

access: closed

type: Journal Article

metadata version: 2023-03-21

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Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
Microprocessor Testing: Functional Meets Structural Test. J. Circuits Syst. Comput. 26(8): 1740007:1-1740007:18 (2017)

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