"Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit ..."

Hui Xu et al. (2023)

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DOI: 10.1142/S021812662350175X

access: closed

type: Journal Article

metadata version: 2023-07-07

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Hui Xu, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang, Zhengfeng Huang:
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. J. Circuits Syst. Comput. 32(10): 2350175:1-2350175:19 (2023)

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