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"Thermal Characterization of Test Techniques for FinFET and 3D Integrated ..."

Aoxiang Tang, Niraj K. Jha (2013)

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DOI: 10.1145/2422094.2422100

access: closed

type: Journal Article

metadata version: 2020-06-08

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Aoxiang Tang, Niraj K. Jha:
Thermal Characterization of Test Techniques for FinFET and 3D Integrated Circuits. ACM J. Emerg. Technol. Comput. Syst. 9(1): 6:1-6:16 (2013)

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