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"Design and evaluation of features and classifiers for OLED panel defect ..."

Van Huan Nguyen et al. (2017)

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DOI: 10.1080/24751839.2017.1355717

access: open

type: Journal Article

metadata version: 2020-10-05

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  - journals/jiat/NguyenPCMK17
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  - https://dblp.org/rec/journals/jiat/NguyenPCMK17
Van Huan Nguyen, Van Huy Pham, Xuenan Cui, Mingjie Ma, Hakil Kim:
Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision. J. Inf. Telecommun. 1(4): 334-350 (2017)

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