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"XRD Patterns and Bismuth Sticking Coefficient in Thin Films Fabricated by ..."

Seung-Ho Yang, Yong-Pil Park (2006)

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DOI: —

access: open

type: Journal Article

metadata version: 2021-02-16

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  dblp key:
  - journals/jicce/YangP06
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  persistent URL:
  - https://dblp.org/rec/journals/jicce/YangP06
Seung-Ho Yang, Yong-Pil Park:
XRD Patterns and Bismuth Sticking Coefficient in Thin Films Fabricated by Ion Beam Sputtering Method. J. Inform. and Commun. Convergence Engineering 4(4): 158-161 (2006)

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