"Characterization of Ultrathin Gate Dielectrics for Nanoscale CMOS ..."

Gi-Wan Yoon, Linh Mai, Jae-Young Lee (2007)

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DOI: —

access: open

type: Journal Article

metadata version: 2021-02-16

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Gi-Wan Yoon, Linh Mai, Jae-Young Lee:
Characterization of Ultrathin Gate Dielectrics for Nanoscale CMOS Applications. J. Inform. and Commun. Convergence Engineering 5(2): 109-111 (2007)

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