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"A Scientometric Study of Technological Trend Based on Patent."

Qi Cao et al. (2019)

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DOI: 10.3233/JID190010

access: closed

type: Journal Article

metadata version: 2024-02-13

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Qi Cao, Hengjin Cai, Jingjing Wang, Xiaoluo Ding, Yi Yang:
A Scientometric Study of Technological Trend Based on Patent. J. Integr. Des. Process. Sci. 23(4): 5-28 (2019)

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