"Machine learning-based non-destructive method for identifying defect ..."

Jun Hee Han et al. (2025)

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DOI: 10.1007/S10845-024-02530-Z

access: closed

type: Journal Article

metadata version: 2025-11-18

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  - https://dblp.org/rec/journals/jim/HanJCYCCKJYY25
Jun Hee Han, Yoonseob Jeong, Minkyu Chun, Sang Won Yoon, Jeong-Hyeon Choi, Young Jun Choi, Young Mi Kim, Sang-Hoon Jung, Joon-Young Yang, Sooyoung Yoon:
Machine learning-based non-destructive method for identifying defect causes in OLED displays to enhance productivity. J. Intell. Manuf. 36(8): 5461-5473 (2025)

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