"Automated defect inspection of LED chip using deep convolutional neural ..."

Hui Lin et al. (2019)

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DOI: 10.1007/S10845-018-1415-X

access: closed

type: Journal Article

metadata version: 2025-01-19

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Hui Lin, Bin Li, Xinggang Wang, Yufeng Shu, Shuanglong Niu:
Automated defect inspection of LED chip using deep convolutional neural network. J. Intell. Manuf. 30(6): 2525-2534 (2019)

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