"SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random ..."

Tsu-Wei Tseng, Jin-Fu Li (2011)

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type: Journal Article

metadata version: 2023-10-17

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Tsu-Wei Tseng, Jin-Fu Li:
SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories. J. Inf. Sci. Eng. 27(2): 643-656 (2011)

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