"Unsupervised selective labeling for semi-supervised industrial defect ..."

Jian Ge et al. (2024)

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DOI: 10.1016/J.JKSUCI.2024.102179

access: open

type: Journal Article

metadata version: 2025-06-17

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Jian Ge, Qin Qin, Shaojing Song, Jinhua Jiang, Zhiwei Shen:
Unsupervised selective labeling for semi-supervised industrial defect detection. J. King Saud Univ. Comput. Inf. Sci. 36(8): 102179 (2024)

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