"Hybrid GA-gradient method for thin films ellipsometric data evaluation."

Krzysztof Dorywalski, Rüdiger Schmidt-Gründ, Marius Grundmann (2020)

> Home

Details and statistics

DOI: 10.1016/J.JOCS.2020.101201

access: closed

type: Journal Article

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jocs/DorywalskiSG20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jocs/DorywalskiSG20
Krzysztof Dorywalski, Rüdiger Schmidt-Gründ, Marius Grundmann:
Hybrid GA-gradient method for thin films ellipsometric data evaluation. J. Comput. Sci. 47: 101201 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.