"Backend-free multi-scale feature fusion network for defect detection in ..."

Yapin Zhang, Ruiqiang Guo, Min Li (2025)

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DOI: 10.1007/S11554-025-01759-Y

access: closed

type: Journal Article

metadata version: 2025-10-14

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Yapin Zhang, Ruiqiang Guo, Min Li:
Backend-free multi-scale feature fusion network for defect detection in printed circuit board images. J. Real Time Image Process. 22(5): 187 (2025)

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