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"Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency ..."

Tony Tae-Hyoung Kim, Randy Persaud, Chris H. Kim (2008)

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DOI: 10.1109/JSSC.2008.917502

access: closed

type: Journal Article

metadata version: 2020-08-30

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Tony Tae-Hyoung Kim, Randy Persaud, Chris H. Kim:
Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits. IEEE J. Solid State Circuits 43(4): 874-880 (2008)

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