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ORCID"A Leakage-Current-Recycling Phase-Locked Loop in 65 nm CMOS Technology."
I-Ting Lee, Yun-Ta Tsai, Shen-Iuan Liu (2012)
- I-Ting Lee, Yun-Ta Tsai, Shen-Iuan Liu:
A Leakage-Current-Recycling Phase-Locked Loop in 65 nm CMOS Technology. IEEE J. Solid State Circuits 47(11): 2693-2700 (2012)
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