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"Highly Reliable Reference Bitline Bias Designs for 64 Mb and 128 Mb Chain ..."

Ryu Ogiwara et al. (2015)

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DOI: 10.1109/JSSC.2015.2405932

access: closed

type: Journal Article

metadata version: 2021-01-15

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Ryu Ogiwara, Daisaburo Takashima, Sumiko M. Doumae, Shinichiro Shiratake, Ryosuke Takizawa, Hidehiro Shiga:
Highly Reliable Reference Bitline Bias Designs for 64 Mb and 128 Mb Chain FeRAMs. IEEE J. Solid State Circuits 50(5): 1324-1331 (2015)

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