"Physical random number generator based on MOS structure after soft breakdown."

Shinichi Yasuda et al. (2004)

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DOI: 10.1109/JSSC.2004.831480

access: closed

type: Journal Article

metadata version: 2022-04-22

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Shinichi Yasuda, Hideki Satake, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Shinobu Fujita:
Physical random number generator based on MOS structure after soft breakdown. IEEE J. Solid State Circuits 39(8): 1375-1377 (2004)

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