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"Design for testability and built-in self-test for VLSI circuits."

Hideo Fujiwara (1986)

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DOI: 10.1016/0141-9331(86)90094-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mam/Fujiwara86
Hideo Fujiwara:
Design for testability and built-in self-test for VLSI circuits. Microprocess. Microsystems 10(3): 139-147 (1986)

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