"Silicon compilation of hierarchical control sections with unified BIST ..."

Michael Nicolaidis et al. (1991)

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DOI: 10.1016/0141-9331(91)90067-P

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type: Journal Article

metadata version: 2022-10-02

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Michael Nicolaidis, Kholdoun Torki, Ahmed Amine Jerraya, Bernard Courtois:
Silicon compilation of hierarchical control sections with unified BIST testability. Microprocess. Microsystems 15(5): 257-269 (1991)

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