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"Test generation for specification test of analog circuits using efficient ..."

Achintya Halder, Abhijit Chatterjee (2005)

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DOI: 10.1016/J.MEJO.2005.03.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Achintya Halder, Abhijit Chatterjee:
Test generation for specification test of analog circuits using efficient test response observation methods. Microelectron. J. 36(9): 820-832 (2005)

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