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"Design concept for wire-bonding reliability improvement by optimizing ..."

Masayasu Ishiko et al. (2006)

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DOI: 10.1016/J.MEJO.2005.09.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Masayasu Ishiko, Masanori Usui, Takashi Ohuchi, Mikio Shirai:
Design concept for wire-bonding reliability improvement by optimizing position in power devices. Microelectron. J. 37(3): 262-268 (2006)

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