"Extraction technique for characterization of electric field distribution ..."

N. Kaushik et al. (2003)

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DOI: 10.1016/S0026-2692(02)00140-4

access: closed

type: Journal Article

metadata version: 2020-02-22

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N. Kaushik, A. Kranti, Mridula Gupta, R. S. Gupta:
Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor. Microelectron. J. 34(1): 77-83 (2003)

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