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"Test power and area optimized logic built-in self-test with higher fault ..."

Vishnupriya Shivakumar, Chinnaiyan Senthilpari, Zubaida Binti Yusoff (2022)

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DOI: 10.1016/J.MEJO.2022.105430

access: closed

type: Journal Article

metadata version: 2024-01-16

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Vishnupriya Shivakumar, Chinnaiyan Senthilpari, Zubaida Binti Yusoff:
Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs. Microelectron. J. 124: 105430 (2022)

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