"Single event double-upset fully immune and transient pulse filterable ..."

Aibin Yan et al. (2017)

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DOI: 10.1016/J.MEJO.2017.01.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/YanHFOD17
Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Yiming Ouyang, Honghui Deng:
Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS. Microelectron. J. 61: 43-50 (2017)

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