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"Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, ..."

Woojin Ahn et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.12.034

access: closed

type: Journal Article

metadata version: 2022-06-03

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Woojin Ahn, Sang Hoon Shin, Chunsheng Jiang, Hai Jiang, M. A. Wahab, Muhammad Ashraful Alam:
Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits. Microelectron. Reliab. 81: 262-273 (2018)

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