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"The impact of process-induced mechanical stress in narrow width devices ..."

Naushad Alam, Bulusu Anand, Sudeb Dasgupta (2013)

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DOI: 10.1016/J.MICROREL.2013.01.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Naushad Alam, Bulusu Anand, Sudeb Dasgupta:
The impact of process-induced mechanical stress in narrow width devices and variable-taper CMOS buffer design. Microelectron. Reliab. 53(5): 718-724 (2013)

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