"Modeling of NBTI saturation effect and its impact on electric field ..."

Hideki Aono et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.12.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hideki Aono, Eiichi Murakami, Kousuke Okuyama, A. Nishida, Masataka Minami, Y. Ooji, Katsuhiko Kubota:
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime. Microelectron. Reliab. 45(7-8): 1109-1114 (2005)

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