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"Evidence for causality between GaN RF HEMT degradation and the ..."
A. R. Arehart et al. (2016)
- A. R. Arehart, A. Sasikumar, Glen David Via, B. S. Poling, E. R. Heller, S. A. Ringel:
Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN. Microelectron. Reliab. 56: 45-48 (2016)
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