"Resistive RAM variability monitoring using a ring oscillator based test chip."

Hassen Aziza, Jean-Michel Portal (2016)

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DOI: 10.1016/J.MICROREL.2016.07.097

access: closed

type: Journal Article

metadata version: 2021-12-24

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Hassen Aziza, Jean-Michel Portal:
Resistive RAM variability monitoring using a ring oscillator based test chip. Microelectron. Reliab. 64: 59-62 (2016)

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