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"Comparative analysis of RF LDMOS capacitance reliability under accelerated ..."

Mohamed Ali Belaïd et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.04.009

access: closed

type: Journal Article

metadata version: 2022-10-02

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Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon:
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectron. Reliab. 47(1): 59-64 (2007)

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