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"Electronic circuit reliability modeling."
Joseph B. Bernstein et al. (2006)
- Joseph B. Bernstein
, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor:
Electronic circuit reliability modeling. Microelectron. Reliab. 46(12): 1957-1979 (2006)
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