"Quantum circuit's reliability assessment with VHDL-based simulated fault ..."

Oana Boncalo et al. (2010)

Details and statistics

DOI: 10.1016/J.MICROREL.2009.11.008

access: closed

type: Journal Article

metadata version: 2020-02-22

a service of  Schloss Dagstuhl - Leibniz Center for Informatics