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"Optimizing the hot carrier reliability of N-LDMOS transistor arrays."

Douglas Brisbin, Andy Strachan, Prasad Chaparala (2005)

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DOI: 10.1016/J.MICROREL.2004.11.054

access: closed

type: Journal Article

metadata version: 2020-02-22

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Douglas Brisbin, Andy Strachan, Prasad Chaparala:
Optimizing the hot carrier reliability of N-LDMOS transistor arrays. Microelectron. Reliab. 45(7-8): 1021-1032 (2005)

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