"Failure analyses for debug and ramp-up of modern IC's."

Christian Burmer, Siegfried Görlich (2006)

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DOI: 10.1016/J.MICROREL.2006.07.024

access: closed

type: Journal Article

metadata version: 2020-02-22

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Christian Burmer, Siegfried Görlich:
Failure analyses for debug and ramp-up of modern IC's. Microelectron. Reliab. 46(9-11): 1486-1497 (2006)

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