
"Field plate related reliability improvements in GaN-on-Si HEMTs."
Alessandro Chini et al. (2012)
- Alessandro Chini
, Fabio Soci, Fausto Fantini
, A. Nanni, A. Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso
, Enrico Zanoni:
Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectron. Reliab. 52(9-10): 2153-2158 (2012)

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