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"The ESD protection characteristic and low-frequency noise analysis of GaN ..."

Hsien-Chin Chiu et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.01.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hsien-Chin Chiu, Ji-Fan Chi, Hsuan-Ling Kao, Chia-Yi Chu, Kuan-Liang Cho, Feng-Tso Chien:
The ESD protection characteristic and low-frequency noise analysis of GaN Schottky barrier diode with fluorine-based plasma treatment. Microelectron. Reliab. 59: 44-48 (2016)

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