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"Measurement and simulation of interfacial adhesion strength between ..."
Tsung-Lin Chou et al. (2011)
- Tsung-Lin Chou, Shin-Yueh Yang, Chung-Jung Wu, Cheng-Nan Han, Kuo-Ning Chiang:
Measurement and simulation of interfacial adhesion strength between SiO2 thin film and III-V material. Microelectron. Reliab. 51(9-11): 1757-1761 (2011)
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