"Thermal and electrical investigation of the reverse bias degradation of ..."

Alessandro Compagnin et al. (2013)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2013.07.013

access: closed

type: Journal Article

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/CompagninMBGCVMZM13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/CompagninMBGCVMZM13
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso:
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53(9-11): 1809-1813 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.