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"Temperature-dependent breakdown and hot carrier stress of PHEMTs."
Paolo Cova et al. (2004)
- Paolo Cova, Nicola Delmonte, Giovanna Sozzi, Roberto Menozzi:
Temperature-dependent breakdown and hot carrier stress of PHEMTs. Microelectron. Reliab. 44(9-11): 1381-1385 (2004)
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