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"Generation-recombination noise in bipolar transistors."

Yisong Dai (2001)

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DOI: 10.1016/S0026-2714(01)00042-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yisong Dai:
Generation-recombination noise in bipolar transistors. Microelectron. Reliab. 41(6): 919-925 (2001)

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