BibTeX record journals/mr/DouLVICMKITTG14

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@article{DBLP:journals/mr/DouLVICMKITTG14,
  author    = {Chunmeng Dou and
               Dennis Lin and
               Abhitosh Vais and
               Tsvetan Ivanov and
               Han{-}Ping Chen and
               Koen Martens and
               Kuniyuki Kakushima and
               Hiroshi Iwai and
               Yuan Taur and
               Aaron Thean and
               Guido Groeseneken},
  title     = {Determination of energy and spatial distribution of oxide border traps
               in In\({}_{\mbox{0.53}}\)Ga\({}_{\mbox{0.47}}\)As {MOS} capacitors
               from capacitance-voltage characteristics measured at various temperatures},
  journal   = {Microelectron. Reliab.},
  volume    = {54},
  number    = {4},
  pages     = {746--754},
  year      = {2014},
  url       = {https://doi.org/10.1016/j.microrel.2013.12.023},
  doi       = {10.1016/j.microrel.2013.12.023},
  timestamp = {Sat, 22 Feb 2020 19:28:36 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/DouLVICMKITTG14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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