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"Experimental and numerical results correlation during extreme use of power ..."

Laurent Dupont et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.127

access: closed

type: Journal Article

metadata version: 2024-01-25

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Laurent Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau:
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. Microelectron. Reliab. 50(9-11): 1804-1809 (2010)

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