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"Negative bias temperature instability modeling for high-voltage oxides at ..."

Robert Entner et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.078

access: closed

type: Journal Article

metadata version: 2020-02-22

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Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer:
Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. Microelectron. Reliab. 47(4-5): 697-699 (2007)

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