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"Degradation dynamics, recovery, and characterization of negative bias ..."
Maxim Ershov et al. (2005)
- Maxim Ershov, Sharad Saxena, Sean Minehane, P. Clifton, Mark Redford, R. Lindley, H. Karbasi, S. Graves, S. Winters:
Degradation dynamics, recovery, and characterization of negative bias temperature instability. Microelectron. Reliab. 45(1): 99-105 (2005)
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